"A novel test scheme for NAND flash memory based on built-in oscillator ring."

Si Chen, Xiaole Cui, Chung Len Lee (2013)

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DOI: 10.1109/ASICON.2013.6811957

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-07

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Si Chen, Xiaole Cui, Chung Len Lee:
A novel test scheme for NAND flash memory based on built-in oscillator ring. ASICON 2013: 1-4

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