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ORCID"Automated Detection of Coffee Bean Defects using Multi-Deep Learning Models."
Chuan-Shiuan Liang et al. (2023)
- Chuan-Shiuan Liang, Zhenyu Xu, Jian-Yu Zhou, Chieh-Ming Yang, Jen-Yeu Chen:
Automated Detection of Coffee Bean Defects using Multi-Deep Learning Models. APWCS 2023: 1-5
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last updated on 2023-09-13 08:43 CEST by the dblp team
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