"A Machine Learning Based Approach to Detect Machine Learning Design Patterns."

Weitao Pan et al. (2023)

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DOI: 10.1109/APSEC60848.2023.00073

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-10

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Weitao Pan, Hironori Washizaki, Nobukazu Yoshioka, Yoshiaki Fukazawa, Foutse Khomh, Yann-Gaël Guéhéneuc:
A Machine Learning Based Approach to Detect Machine Learning Design Patterns. APSEC 2023: 574-578

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