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"Low Dose-Rate, High Total Dose Set-Up for Rad-Hard CMOS I/O Circuits Testing."

Calogero Pace et al. (2016)

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DOI: 10.1007/978-3-319-55071-8_4

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  dblp key:
  - conf/applepies/PaceFPSMF16
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  - https://dblp.org/rec/conf/applepies/PaceFPSMF16
Calogero Pace, Letizia Fragomeni, Aldo Parlato, Andrea Solano, Nicolò Marchese, Daniela Fiore:
Low Dose-Rate, High Total Dose Set-Up for Rad-Hard CMOS I/O Circuits Testing. ApplePies 2016: 27-33

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