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"$2 \times \text{VDD}$ Tolerant I/O with Considerations of Hot-Carrier ..."

Dharmaray Nedalgi, Saroja V. Siddamal (2021)

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DOI: 10.1109/APCCAS51387.2021.9687809

access: closed

type: Conference or Workshop Paper

metadata version: 2022-02-11

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Dharmaray Nedalgi, Saroja V. Siddamal:
$2 \times \text{VDD}$ Tolerant I/O with Considerations of Hot-Carrier Degradation and Gate-Oxide Reliability. APCCAS 2021: 97-100

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