"Cumulative electrostatic discharge induced degradation of power-rail ESD ..."

Chung-Ti Hsu et al. (2008)

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DOI: 10.1109/APCCAS.2008.4745957

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Chung-Ti Hsu, Shu-Chuan Chen, Yen-Hsien Chen, Yu-Ti Su, Ming-Fang Lai, Che-Hung Chen, Po-An Chen:
Cumulative electrostatic discharge induced degradation of power-rail ESD clamp device in high-voltage CMOS/DMOS technologies. APCCAS 2008: 49-52

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