"Measuring the Response Bias Induced by an Experience and Application ..."

Boris E. R. de Ruyter, Rick van Geel, Panos Markopoulos (2009)

Details and statistics

DOI: 10.1007/978-3-642-05408-2_28

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-01

a service of  Schloss Dagstuhl - Leibniz Center for Informatics