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"Sensor fault detection by testing the largest eigenvalue of the innovation ..."

Chingiz Hajiyev (2010)

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DOI: 10.1109/ACC.2010.5530786

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Chingiz Hajiyev:
Sensor fault detection by testing the largest eigenvalue of the innovation covariance using Tracy-Widom distribution. ACC 2010: 5427-5432

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