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"Item Difficulty Constrained Uniform Adaptive Testing."

Wakaba Kishida et al. (2023)

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DOI: 10.1007/978-3-031-36336-8_88

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-03

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  dblp key:
  - conf/aied/KishidaFMU23
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  - https://dblp.org/rec/conf/aied/KishidaFMU23
Wakaba Kishida, Kazuma Fuchimoto, Yoshimitsu Miyazawa, Maomi Ueno:
Item Difficulty Constrained Uniform Adaptive Testing. AIED (Posters/Late Breaking Results/...) 2023: 568-573

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