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"Novel Heuristic and Genetic Algorithms for the VLSI Test Coverage Problem."

Walid Ibrahim, Amr El-Chouemi, Hesham El-Sayed (2006)

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DOI: 10.1109/AICCSA.2006.205122

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/aiccsa/IbrahimEE06
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  persistent URL:
  - https://dblp.org/rec/conf/aiccsa/IbrahimEE06
Walid Ibrahim, Amr El-Chouemi, Hesham El-Sayed:
Novel Heuristic and Genetic Algorithms for the VLSI Test Coverage Problem. AICCSA 2006: 402-408

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