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"Deep-learning-based X-ray CT Slice Analysis for Layout Verification in ..."

Deruo Cheng et al. (2023)

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DOI: 10.1109/AICAS57966.2023.10168608

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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  - conf/aicas/ChengSTSWWG23
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  - https://dblp.org/rec/conf/aicas/ChengSTSWWG23
Deruo Cheng, Yiqiong Shi, Yee-Yang Tee, Jingsi Song, Xue Wang, Bihan Wen, Bah-Hwee Gwee:
Deep-learning-based X-ray CT Slice Analysis for Layout Verification in Printed Circuit Boards. AICAS 2023: 1-5

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