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"A method of test generation for fault location in combinational logic."

Y. Koga, C. Chen, K. Naemura (1970)

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DOI: 10.1145/1478462.1478473

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/afips/KogaCN70
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  - https://dblp.org/rec/conf/afips/KogaCN70
Y. Koga, C. Chen, K. Naemura:
A method of test generation for fault location in combinational logic. AFIPS Fall Joint Computing Conference 1970: 69-78

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