"Reliability Sequential Sampling Test Based on Exponential Lifetime ..."

Tien-Tsai Huang, Chien-Ming Huang, Kevin Kuan-Shun Chiu (2012)

Details and statistics

DOI: 10.1007/978-3-642-28493-9_37

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

a service of  Schloss Dagstuhl - Leibniz Center for Informatics