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"Summarization of Multidimensional Process Traces for Analysis under ..."

Phuong Nguyen et al. (2020)

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DOI: 10.1109/SCC49832.2020.00070

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-21

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  dblp key:
  - conf/IEEEscc/NguyenIMS20
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Phuong Nguyen, Vatche Isahagian, Vinod Muthusamy, Aleksander Slominski:
Summarization of Multidimensional Process Traces for Analysis under Edit-distance Constraints. SCC 2020: 466-468

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