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"Exploiting Coarse-Grain Verification Parallelism for Power-Efficient Fault ..."

M. Wasiur Rashid et al. (2005)

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DOI: 10.1109/PACT.2005.20

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/IEEEpact/RashidTHA05
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  persistent URL:
  - https://dblp.org/rec/conf/IEEEpact/RashidTHA05
M. Wasiur Rashid, Edwin J. Tan, Michael C. Huang, David H. Albonesi:
Exploiting Coarse-Grain Verification Parallelism for Power-Efficient Fault Tolerance. IEEE PACT 2005: 315-328

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