"Local Condition Monitoring in integrated circuits using a set of ..."

Lionel Vincent et al. (2012)

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DOI: 10.1109/CCA.2012.6402386

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-02

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Lionel Vincent, Suzanne Lesecq, Philippe Maurine, Edith Beigné:
Local Condition Monitoring in integrated circuits using a set of Kolmogorov-Smirnov tests. CCA 2012: 646-651

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