"Inspection of microchip mounting tolerances by 3D vision."

Stefan Behler, Martin von Arx (2008)

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DOI: 10.1117/12.764830

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Stefan Behler, Martin von Arx:
Inspection of microchip mounting tolerances by 3D vision. Three-Dimensional Image Capture and Applications 2008: 680504

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