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"Crystallinity Dependence of Long-Term Reliability of Electroplated Gold ..."

Ken Suzuki et al. (2019)

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DOI: 10.1109/3DIC48104.2019.9058897

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  dblp key:
  - conf/3dic/SuzukiMNM19
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  - https://dblp.org/rec/conf/3dic/SuzukiMNM19
Ken Suzuki, Ryota Mizuno, Yutaro Nakoshi, Hideo Miura:
Crystallinity Dependence of Long-Term Reliability of Electroplated Gold Thin-Film Interconnections. 3DIC 2019: 1-5

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