default search action
"Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs."
Brandon Noia, Krishnendu Chakrabarty (2014)
- Brandon Noia, Krishnendu Chakrabarty:
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs. Springer 2014, ISBN 978-3-319-02377-9, pp. I-XVIII, 1-245
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.