BibTeX record journals/tvlsi/KraakTAHWCC19

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@article{DBLP:journals/tvlsi/KraakTAHWCC19,
  author    = {Daniel Kraak and
               Mottaqiallah Taouil and
               Innocent Agbo and
               Said Hamdioui and
               Pieter Weckx and
               Stefan Cosemans and
               Francky Catthoor},
  title     = {Parametric and Functional Degradation Analysis of Complete 14-nm FinFET
               {SRAM}},
  journal   = {{IEEE} Trans. {VLSI} Syst.},
  volume    = {27},
  number    = {6},
  pages     = {1308--1321},
  year      = {2019},
  url       = {https://doi.org/10.1109/TVLSI.2019.2902881},
  doi       = {10.1109/TVLSI.2019.2902881},
  timestamp = {Fri, 05 Jul 2019 09:39:50 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tvlsi/KraakTAHWCC19},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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