BibTeX record journals/tvlsi/GongQW19

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@article{DBLP:journals/tvlsi/GongQW19,
  author       = {Yanping Gong and
                  Fengyu Qian and
                  Lei Wang},
  title        = {Design for Test and Hardware Security Utilizing Retention Loss of
                  Memristors},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {27},
  number       = {11},
  pages        = {2536--2547},
  year         = {2019},
  url          = {https://doi.org/10.1109/TVLSI.2019.2936573},
  doi          = {10.1109/TVLSI.2019.2936573},
  timestamp    = {Mon, 28 Aug 2023 21:30:40 +0200},
  biburl       = {https://dblp.org/rec/journals/tvlsi/GongQW19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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