BibTeX record journals/tr/PasquiniCM96

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@article{DBLP:journals/tr/PasquiniCM96,
  author       = {Alberto Pasquini and
                  Adalberto Nobiato Crespo and
                  Paolo Matrella},
  title        = {Sensitivity of reliability-growth models to operational profile errors
                  vs. testing accuracy [software testing]},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {45},
  number       = {4},
  pages        = {531--540},
  year         = {1996},
  url          = {https://doi.org/10.1109/24.556576},
  doi          = {10.1109/24.556576},
  timestamp    = {Thu, 09 Jul 2020 22:46:51 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/PasquiniCM96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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