BibTeX record journals/tr/DuC16

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@article{DBLP:journals/tr/DuC16,
  author       = {Yankang Du and
                  Shuming Chen},
  title        = {A Novel Layout-Based Single Event Transient Injection Approach to
                  Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary
                  Metal-Oxide-Semiconductor Bulk Technology},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {65},
  number       = {1},
  pages        = {248--255},
  year         = {2016},
  url          = {https://doi.org/10.1109/TR.2015.2427372},
  doi          = {10.1109/TR.2015.2427372},
  timestamp    = {Thu, 09 Jul 2020 22:46:59 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/DuC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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