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BibTeX record journals/todaes/XuNZY015
@article{DBLP:journals/todaes/XuNZY015, author = {Cong Xu and Dimin Niu and Yang Zheng and Shimeng Yu and Yuan Xie}, title = {Impact of Cell Failure on Reliable Cross-Point Resistive Memory Design}, journal = {{ACM} Trans. Design Autom. Electr. Syst.}, volume = {20}, number = {4}, pages = {63:1--63:21}, year = {2015}, url = {https://doi.org/10.1145/2753759}, doi = {10.1145/2753759}, timestamp = {Tue, 21 Mar 2023 21:13:55 +0100}, biburl = {https://dblp.org/rec/journals/todaes/XuNZY015.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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