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BibTeX record journals/tcad/YuanYP10
@article{DBLP:journals/tcad/YuanYP10, author = {Kun Yuan and Jae{-}Seok Yang and David Z. Pan}, title = {Double Patterning Layout Decomposition for Simultaneous Conflict and Stitch Minimization}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {29}, number = {2}, pages = {185--196}, year = {2010}, url = {https://doi.org/10.1109/TCAD.2009.2035577}, doi = {10.1109/TCAD.2009.2035577}, timestamp = {Thu, 24 Sep 2020 11:27:24 +0200}, biburl = {https://dblp.org/rec/journals/tcad/YuanYP10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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