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BibTeX record journals/tcad/SethA84
@article{DBLP:journals/tcad/SethA84, author = {Sharad C. Seth and Vishwani D. Agrawal}, title = {Characterizing the {LSI} Yield Equation from Wafer Test Data}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {3}, number = {2}, pages = {123--126}, year = {1984}, url = {https://doi.org/10.1109/TCAD.1984.1270065}, doi = {10.1109/TCAD.1984.1270065}, timestamp = {Thu, 24 Sep 2020 11:26:41 +0200}, biburl = {https://dblp.org/rec/journals/tcad/SethA84.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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