BibTeX record journals/tcad/LiLLL14

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@article{DBLP:journals/tcad/LiLLL14,
  author       = {Yi{-}Hua Li and
                  Wei{-}Cheng Lien and
                  Ing{-}Chao Lin and
                  Kuen{-}Jong Lee},
  title        = {Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based
                  Testing},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {33},
  number       = {1},
  pages        = {127--138},
  year         = {2014},
  url          = {https://doi.org/10.1109/TCAD.2013.2282281},
  doi          = {10.1109/TCAD.2013.2282281},
  timestamp    = {Thu, 14 Oct 2021 09:40:27 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/LiLLL14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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