BibTeX record journals/tcad/Al-YamaniDCGG07

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@article{DBLP:journals/tcad/Al-YamaniDCGG07,
  author       = {Ahmad A. Al{-}Yamani and
                  Narendra Devta{-}Prasanna and
                  Erik Chmelar and
                  M. Grinchuk and
                  Arun Gunda},
  title        = {Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {26},
  number       = {5},
  pages        = {907--918},
  year         = {2007},
  url          = {https://doi.org/10.1109/TCAD.2007.8361584},
  doi          = {10.1109/TCAD.2007.8361584},
  timestamp    = {Thu, 24 Sep 2020 11:28:16 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/Al-YamaniDCGG07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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