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BibTeX record journals/mr/WeirLSA05
@article{DBLP:journals/mr/WeirLSA05, author = {Bonnie E. Weir and Che{-}Choi Leung and Paul J. Silverman and Muhammad Ashraful Alam}, title = {Gate dielectric breakdown in the time-scale of {ESD} events}, journal = {Microelectron. Reliab.}, volume = {45}, number = {3-4}, pages = {427--436}, year = {2005}, url = {https://doi.org/10.1016/j.microrel.2004.12.004}, doi = {10.1016/J.MICROREL.2004.12.004}, timestamp = {Fri, 03 Jun 2022 15:48:32 +0200}, biburl = {https://dblp.org/rec/journals/mr/WeirLSA05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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