BibTeX record journals/mr/WeirLSA05

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@article{DBLP:journals/mr/WeirLSA05,
  author       = {Bonnie E. Weir and
                  Che{-}Choi Leung and
                  Paul J. Silverman and
                  Muhammad Ashraful Alam},
  title        = {Gate dielectric breakdown in the time-scale of {ESD} events},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {3-4},
  pages        = {427--436},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2004.12.004},
  doi          = {10.1016/J.MICROREL.2004.12.004},
  timestamp    = {Fri, 03 Jun 2022 15:48:32 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/WeirLSA05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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