BibTeX record journals/mr/WangWHSHG18

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@article{DBLP:journals/mr/WangWHSHG18,
  author       = {Tun Wang and
                  Baoming Wang and
                  Aman Haque and
                  Michael Snure and
                  Eric Heller and
                  Nicholas Glavin},
  title        = {Mechanical stress effects on electrical breakdown of freestanding
                  GaN thin films},
  journal      = {Microelectron. Reliab.},
  volume       = {81},
  pages        = {181--185},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2017.12.033},
  doi          = {10.1016/J.MICROREL.2017.12.033},
  timestamp    = {Sat, 30 Sep 2023 10:21:36 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/WangWHSHG18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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