BibTeX record journals/mr/WangLHZYZGXGCC18

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@article{DBLP:journals/mr/WangLHZYZGXGCC18,
  author    = {Jian Wang and
               Binhong Li and
               Yang Huang and
               Kai Zhao and
               Fang Yu and
               Qiwen Zheng and
               Qi Guo and
               Liewei Xu and
               J. Gao and
               X. Cai and
               Y. Cui},
  title     = {The total ionizing dose response of leading-edge {FDSOI} MOSFETs},
  journal   = {Microelectronics Reliability},
  volume    = {88-90},
  pages     = {979--983},
  year      = {2018},
  url       = {https://doi.org/10.1016/j.microrel.2018.07.080},
  doi       = {10.1016/j.microrel.2018.07.080},
  timestamp = {Mon, 07 Jan 2019 12:04:19 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/WangLHZYZGXGCC18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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