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BibTeX record journals/mr/Stojcev03d
@article{DBLP:journals/mr/Stojcev03d, author = {Mile K. Stojcev}, title = {High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test; R. Dean Adams, Kluwer Academic Publishers, Boston, 2003, Hardcover, pp 247, plus XIII, {ISBN} 1-4020-7255-4}, journal = {Microelectron. Reliab.}, volume = {43}, number = {5}, pages = {819}, year = {2003}, url = {https://doi.org/10.1016/S0026-2714(03)00056-8}, doi = {10.1016/S0026-2714(03)00056-8}, timestamp = {Sat, 22 Feb 2020 19:29:06 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev03d.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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