BibTeX record journals/mr/MroczynskiB12

download as .bib file

@article{DBLP:journals/mr/MroczynskiB12,
  author       = {Robert Mroczynski and
                  Romuald B. Beck},
  title        = {Reliability issues of double gate dielectric stacks based on hafnium
                  dioxide (HfO\({}_{\mbox{2}}\)) layers for non-volatile semiconductor
                  memory {(NVSM)} applications},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {1},
  pages        = {107--111},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2011.08.010},
  doi          = {10.1016/J.MICROREL.2011.08.010},
  timestamp    = {Sat, 22 Feb 2020 19:27:41 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MroczynskiB12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.