BibTeX record journals/mr/MessarisKFTNGD16

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@article{DBLP:journals/mr/MessarisKFTNGD16,
  author    = {Ioannis Messaris and
               T. A. Karatsori and
               Nikolaos Fasarakis and
               Christoforos Theodorou and
               Spiros Nikolaidis and
               G{\'{e}}rard Ghibaudo and
               C. A. Dimitriadis},
  title     = {Hot carrier degradation modeling of short-channel n-FinFETs suitable
               for circuit simulators},
  journal   = {Microelectronics Reliability},
  volume    = {56},
  pages     = {10--16},
  year      = {2016},
  url       = {https://doi.org/10.1016/j.microrel.2015.11.002},
  doi       = {10.1016/j.microrel.2015.11.002},
  timestamp = {Wed, 10 Jul 2019 14:40:54 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/mr/MessarisKFTNGD16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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