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BibTeX record journals/mr/LeiGTZZCEHCP18
@article{DBLP:journals/mr/LeiGTZZCEHCP18, author = {Zhifeng Lei and H. X. Guo and M. H. Tang and C. Zeng and Zhangang Zhang and H. Chen and Y. F. En and Y. Huang and Yiqiang Chen and Chao Peng}, title = {Degradation mechanisms of AlGaN/GaN HEMTs under 800 MeV Bi ions irradiation}, journal = {Microelectron. Reliab.}, volume = {80}, pages = {312--316}, year = {2018}, url = {https://doi.org/10.1016/j.microrel.2017.07.086}, doi = {10.1016/J.MICROREL.2017.07.086}, timestamp = {Sun, 30 Jul 2023 10:28:02 +0200}, biburl = {https://dblp.org/rec/journals/mr/LeiGTZZCEHCP18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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