BibTeX record journals/mr/Kuehl02

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@article{DBLP:journals/mr/Kuehl02,
  author       = {Reiner W. Kuehl},
  title        = {Reliability of thin-film resistors: impact of third harmonic screenings},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {6},
  pages        = {807--813},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00012-4},
  doi          = {10.1016/S0026-2714(02)00012-4},
  timestamp    = {Sat, 22 Feb 2020 19:28:27 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Kuehl02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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