BibTeX record journals/mr/KaczerFWRPBSCLP18

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@article{DBLP:journals/mr/KaczerFWRPBSCLP18,
  author    = {Ben Kaczer and
               Jacopo Franco and
               Pieter Weckx and
               Philippe Roussel and
               V. Putcha and
               Erik Bury and
               Marco Simicic and
               Adrian Chasin and
               Dimitri Linten and
               Bertrand Parvais and
               Francky Catthoor and
               Gerhard Rzepa and
               Michael Waltl and
               Tibor Grasser},
  title     = {A brief overview of gate oxide defect properties and their relation
               to {MOSFET} instabilities and device and circuit time-dependent variability},
  journal   = {Microelectronics Reliability},
  volume    = {81},
  pages     = {186--194},
  year      = {2018},
  url       = {https://doi.org/10.1016/j.microrel.2017.11.022},
  doi       = {10.1016/j.microrel.2017.11.022},
  timestamp = {Sat, 19 Oct 2019 19:52:55 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/mr/KaczerFWRPBSCLP18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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