BibTeX record journals/mr/ChoiHYP14

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@article{DBLP:journals/mr/ChoiHYP14,
  author       = {Jin Hyung Choi and
                  Jin{-}Woo Han and
                  Chong{-}Gun Yu and
                  Jong Tae Park},
  title        = {Hot carrier and {PBTI} induced degradation in silicon nanowire gate-all-around
                  {SONOS} MOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {9-10},
  pages        = {2325--2328},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.07.044},
  doi          = {10.1016/J.MICROREL.2014.07.044},
  timestamp    = {Sun, 02 Oct 2022 15:43:59 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ChoiHYP14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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