BibTeX record journals/ieicet/MatsumotoUHKMMOKYYN05

download as .bib file

@article{DBLP:journals/ieicet/MatsumotoUHKMMOKYYN05,
  author       = {Shizunori Matsumoto and
                  Hiroaki Ueno and
                  Satoshi Hosokawa and
                  Toshihiko Kitamura and
                  Mitiko Miura{-}Mattausch and
                  Hans J{\"{u}}rgen Mattausch and
                  Tatsuya Ohguro and
                  Shigetaka Kumashiro and
                  Tetsuya Yamaguchi and
                  Kyoji Yamashita and
                  Noriaki Nakayama},
  title        = {1/\emph{f}-Noise Characteristics in 100 nm-MOSFETs and Its Modeling
                  for Circuit Simulation},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {88-C},
  number       = {2},
  pages        = {247--254},
  year         = {2005},
  url          = {https://doi.org/10.1093/ietele/E88-C.2.247},
  doi          = {10.1093/IETELE/E88-C.2.247},
  timestamp    = {Sat, 11 Apr 2020 14:48:51 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/MatsumotoUHKMMOKYYN05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics