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BibTeX record journals/ieicet/ImamotoSE11
@article{DBLP:journals/ieicet/ImamotoSE11, author = {Takuya Imamoto and Takeshi Sasaki and Tetsuo Endoh}, title = {Evaluation of 1/f Noise Characteristics in High-k/Metal Gate and SiON/Poly-Si Gate {MOSFET} with 65 nm {CMOS} Process}, journal = {{IEICE} Trans. Electron.}, volume = {94-C}, number = {5}, pages = {724--729}, year = {2011}, url = {https://doi.org/10.1587/transele.E94.C.724}, doi = {10.1587/TRANSELE.E94.C.724}, timestamp = {Sat, 11 Apr 2020 14:48:55 +0200}, biburl = {https://dblp.org/rec/journals/ieicet/ImamotoSE11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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