BibTeX record journals/iee-sej/BurgessD84

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@article{DBLP:journals/iee-sej/BurgessD84,
  author       = {N. Burgess and
                  Robert I. Damper},
  title        = {The inadequacy of the stuck-at fault model for testing mos lsi circuits:
                  a review of mos failure mechanisms and some implications for computer-aided
                  design and test of mos lsi circuits},
  journal      = {Softw. Microsystems},
  volume       = {3},
  number       = {2},
  pages        = {30--36},
  year         = {1984},
  url          = {https://doi.org/10.1049/sm.1984.0011},
  doi          = {10.1049/SM.1984.0011},
  timestamp    = {Fri, 13 Aug 2021 09:32:48 +0200},
  biburl       = {https://dblp.org/rec/journals/iee-sej/BurgessD84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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