BibTeX record journals/et/HouL14

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@article{DBLP:journals/et/HouL14,
  author       = {Chih{-}Sheng Hou and
                  Jin{-}Fu Li},
  title        = {Testing Disturbance Faults in Various {NAND} Flash Memories},
  journal      = {J. Electron. Test.},
  volume       = {30},
  number       = {6},
  pages        = {643--652},
  year         = {2014},
  url          = {https://doi.org/10.1007/s10836-014-5487-z},
  doi          = {10.1007/S10836-014-5487-Z},
  timestamp    = {Tue, 17 Oct 2023 15:22:33 +0200},
  biburl       = {https://dblp.org/rec/journals/et/HouL14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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