BibTeX record journals/et/GoelM03

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@article{DBLP:journals/et/GoelM03,
  author       = {Sandeep Kumar Goel and
                  Erik Jan Marinissen},
  title        = {A Test Time Reduction Algorithm for Test Architecture Design for Core-Based
                  System Chips},
  journal      = {J. Electron. Test.},
  volume       = {19},
  number       = {4},
  pages        = {425--435},
  year         = {2003},
  url          = {https://doi.org/10.1023/A:1024644026761},
  doi          = {10.1023/A:1024644026761},
  timestamp    = {Mon, 05 Feb 2024 20:24:28 +0100},
  biburl       = {https://dblp.org/rec/journals/et/GoelM03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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