BibTeX record journals/eswa/LiH09

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@article{DBLP:journals/eswa/LiH09,
  author       = {Te{-}Sheng Li and
                  Cheng{-}Lung Huang},
  title        = {Defect spatial pattern recognition using a hybrid {SOM-SVM} approach
                  in semiconductor manufacturing},
  journal      = {Expert Syst. Appl.},
  volume       = {36},
  number       = {1},
  pages        = {374--385},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.eswa.2007.09.023},
  doi          = {10.1016/J.ESWA.2007.09.023},
  timestamp    = {Fri, 26 May 2017 22:54:14 +0200},
  biburl       = {https://dblp.org/rec/journals/eswa/LiH09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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