BibTeX record journals/eor/YuanK08

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@article{DBLP:journals/eor/YuanK08,
  author       = {Tao Yuan and
                  Way Kuo},
  title        = {Spatial defect pattern recognition on semiconductor wafers using model-based
                  clustering and Bayesian inference},
  journal      = {Eur. J. Oper. Res.},
  volume       = {190},
  number       = {1},
  pages        = {228--240},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.ejor.2007.06.007},
  doi          = {10.1016/J.EJOR.2007.06.007},
  timestamp    = {Fri, 21 Feb 2020 13:17:09 +0100},
  biburl       = {https://dblp.org/rec/journals/eor/YuanK08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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