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BibTeX record journals/eccc/ECCC-TR05-150
@article{DBLP:journals/eccc/ECCC-TR05-150, author = {Neeraj Kayal and Nitin Saxena}, title = {Polynomial Identity Testing for Depth 3 Circuits}, journal = {Electron. Colloquium Comput. Complex.}, volume = {{TR05-150}}, year = {2005}, url = {https://eccc.weizmann.ac.il/eccc-reports/2005/TR05-150/index.html}, eprinttype = {ECCC}, eprint = {TR05-150}, timestamp = {Wed, 28 Sep 2022 15:27:24 +0200}, biburl = {https://dblp.org/rec/journals/eccc/ECCC-TR05-150.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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