BibTeX record journals/dt/TsukudeAHKHSF93

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@article{DBLP:journals/dt/TsukudeAHKHSF93,
  author       = {Masaki Tsukude and
                  Kazutami Arimoto and
                  Hideto Hidaka and
                  Yasuhiro Konishi and
                  Masanori Hayashikoshi and
                  Katsuhiro Suma and
                  Kazuyasu Fujishima},
  title        = {Highly Reliable Testing of {ULSI} Memories with On-Chip Voltage-Down
                  Converters},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {10},
  number       = {2},
  pages        = {6--12},
  year         = {1993},
  url          = {https://doi.org/10.1109/54.211523},
  doi          = {10.1109/54.211523},
  timestamp    = {Sun, 17 May 2020 11:43:59 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/TsukudeAHKHSF93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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