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BibTeX record journals/dt/TamB12
@article{DBLP:journals/dt/TamB12, author = {Wing Chiu Tam and Ronald D. Blanton}, title = {Physically-Aware Analysis of Systematic Defects in Integrated Circuits}, journal = {{IEEE} Des. Test Comput.}, volume = {29}, number = {5}, pages = {81--93}, year = {2012}, url = {https://doi.org/10.1109/MDT.2012.2211093}, doi = {10.1109/MDT.2012.2211093}, timestamp = {Sun, 17 May 2020 11:44:36 +0200}, biburl = {https://dblp.org/rec/journals/dt/TamB12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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