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BibTeX record conf/vts/GinezDGLPV07
@inproceedings{DBLP:conf/vts/GinezDGLPV07, author = {Olivier Ginez and Jean Michel Daga and Patrick Girard and Christian Landrault and Serge Pravossoudovitch and Arnaud Virazel}, title = {Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window}, booktitle = {25th {IEEE} {VLSI} Test Symposium {(VTS} 2007), 6-10 May 2007, Berkeley, California, {USA}}, pages = {47--52}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/VTS.2007.52}, doi = {10.1109/VTS.2007.52}, timestamp = {Fri, 24 Mar 2023 00:04:04 +0100}, biburl = {https://dblp.org/rec/conf/vts/GinezDGLPV07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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