BibTeX record conf/vts/GinezDGLPV07

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@inproceedings{DBLP:conf/vts/GinezDGLPV07,
  author       = {Olivier Ginez and
                  Jean Michel Daga and
                  Patrick Girard and
                  Christian Landrault and
                  Serge Pravossoudovitch and
                  Arnaud Virazel},
  title        = {Retention and Reliability Problems in Embedded Flash Memories: Analysis
                  and Test of Defective 2T-FLOTOX Tunnel Window},
  booktitle    = {25th {IEEE} {VLSI} Test Symposium {(VTS} 2007), 6-10 May 2007, Berkeley,
                  California, {USA}},
  pages        = {47--52},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/VTS.2007.52},
  doi          = {10.1109/VTS.2007.52},
  timestamp    = {Fri, 24 Mar 2023 00:04:04 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/GinezDGLPV07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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