BibTeX record conf/vts/EngelkePRSB04

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@inproceedings{DBLP:conf/vts/EngelkePRSB04,
  author       = {Piet Engelke and
                  Ilia Polian and
                  Michel Renovell and
                  Bharath Seshadri and
                  Bernd Becker},
  title        = {The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on
                  Resistive Bridging Faults},
  booktitle    = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
                  Napa Valley, CA, {USA}},
  pages        = {171--178},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/VTEST.2004.1299240},
  doi          = {10.1109/VTEST.2004.1299240},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/EngelkePRSB04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}